IV. NOISE MEASUREMENTS
The electrical fluctuations that we refer to as noise form a very complex signal that does not lend itself to straightforward amplitude measurements. A number of special techniques have therefore been developed
for measuring noise. A comprehensive discussion of noise measurement is outside the scope of this publication. However, some of the methods which apply to television systems are discussed in this section.
Special filters are generally required for noise measurements.
These filters are used to separate the noise into its various frequency components for analysis. Each measurement standard typically calls for three or four measurements made with various combinations of the
filters. Note that specifications for the filters vary from standard to standard.
The tangential method of noise measurement, useful for making operational measurements of random noise, is the only method discussed in detail in this publication. While not the most accurate technique, the
tangential measurement can provide a quick way of keeping track of system noise performance over time. Tangential noise measurements are made with a specially equipped waveform monitor. This feature
is standard in the 1781R.
Specialized equipment is required to completely characterize the noise performance of a system. Until recently, these capabilities were available only in dedicated noise measurement instruments. The VM700T,
however, makes highly accurate noise measurements using filters implemented in software. The noise measurement features of the VM700T are reviewed briefly in this section.
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Table of Contents
The electrical fluctuations that we refer to as noise form a very complex signal that does not lend itself to straightforward amplitude measurements. A number of special techniques have therefore been developed
for measuring noise. A comprehensive discussion of noise measurement is outside the scope of this publication. However, some of the methods which apply to television systems are discussed in this section.
Special filters are generally required for noise measurements.
These filters are used to separate the noise into its various frequency components for analysis. Each measurement standard typically calls for three or four measurements made with various combinations of the
filters. Note that specifications for the filters vary from standard to standard.
The tangential method of noise measurement, useful for making operational measurements of random noise, is the only method discussed in detail in this publication. While not the most accurate technique, the
tangential measurement can provide a quick way of keeping track of system noise performance over time. Tangential noise measurements are made with a specially equipped waveform monitor. This feature
is standard in the 1781R.
Specialized equipment is required to completely characterize the noise performance of a system. Until recently, these capabilities were available only in dedicated noise measurement instruments. The VM700T,
however, makes highly accurate noise measurements using filters implemented in software. The noise measurement features of the VM700T are reviewed briefly in this section.
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Table of Contents
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APPENDICES
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